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Experimental microwave study of metal-to-metal point-contact diodes

M. PyéeLaboratorie d'Electronique et de Résonnance Magnétique, Universite de Paris VI, Paris, FranceJ. UebersfeldLaboratorie d'Electronique et de Résonnance Magnétique, Universite de Paris VI, Paris, FranceJ. AuvrayLaboratorie d'Electronique et de Résonnance Magnétique, Universite de Paris VI, Paris, FranceC. GastaudLaboratorie d'Electronique et de Résonnance Magnétique, Universite de Paris VI, Paris, France

1974en

ABI

Annotatsiya

New characteristics obtained with metal-insulator-metal (MIM) diodes are studied. These new characteristics are interpreted according to the tunneling process, and they are compared with the characteristics one can obtain with the IN23 diodes.

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Identifikatorlar

DOI: 10.1109/proc.1974.9462

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