Third-order susceptibility measurements by nonlinear image processing
Georges BoudebsLaboratoire des Propriétes Optiques des Materiaux et Applications, Université d’Angers, 2, boulevard Lavoisier, 49045 Angers Cedex 01, FranceMihaela ChişLaboratoire des Propriétes Optiques des Materiaux et Applications, Université d’Angers, 2, boulevard Lavoisier, 49045 Angers Cedex 01, FranceJ.P. BourdinLaboratoire des Propriétes Optiques des Materiaux et Applications, Université d’Angers, 2, boulevard Lavoisier, 49045 Angers Cedex 01, France
1996en
ABI
Annotatsiya
We present a two-wave mixing configuration associated with a coherent optical processor (4-f system) to characterize the third-order susceptibility coefficient. An accurate measurement of the spatial structure of the intensity becomes possible with a CCD camera, which simplifies and improves the accuracy of third-order susceptibility measurements. To verify the validity of the method, measurements of reference materials illuminated by linearly polarized light are carried out. Good agreement with other measurements by various authors is obtained.
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