Ushbu ishga iqtibos qilgan ishlar

2 ta ish

Ish: A High-Sensitivity System for Cathodoluminescent Studies with the Camebax Electron Probe Microanalyzer

1. Silicon Cluster Aggregation in Silica Layers

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   ABIABI:AkademIndex/openalex/2009.article.000174

2. Far-Action Defects Formation and Gettering in 6H-SiC Lely Crystals Irradiated by Bi

   D.B. Shustov, E. Kolesnikova, Evgenia V. Kalinina +2

   MaqolaSilicon Carbide Semiconductor TechnologiesDiffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena20090 iqtibos

   ABIABI:AkademIndex/openalex/2009.article.000273