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30 ta ish
Ish: Contribution to the Physical Modelling of Single Charged Defects Causing the Random Telegraph Noise in Junctionless FinFET
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AkademBaseEkotizim uchun ochiq API30 ta ish
Ish: Contribution to the Physical Modelling of Single Charged Defects Causing the Random Telegraph Noise in Junctionless FinFET