Experimental study on Hamming and Hsiao codes in the context of embedded applications

Increasing soft error rate and decreasing technological nodes sizes pave a way for Error Correcting Codes (ECC) widespread use in embedded systems. Depending on application safety goals and acceptable performance and area overhead, different codes can be selected. The goal of this paper is to investigate the efficiency and expediency of two of the most prominent ECC codes, Hamming and Hsiao, in the context of embedded memories and provide practical guidance for their exploitation.

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