Application of Error Detection and Correction Techniques to Self-Checking VLSI Systems: An Overview

Currently, the focus of VLSI industry has shifted towards circuit testability, as the advancements in technology yield more intricate and highly compact chips. With the increasing complexity of modern circuits, it is crucial to ensure that VLSI circuits yield accurate and reliable results. The use of self-checking circuits, which incorporate built-in error detection mechanism offers a promising solution to this challenge. This paper presents a comparative study of various error detection and correction techniques for self-checking circuits from existing research papers. The study's findings indicate that usage of modulo 3 residue code as self-checking circuits can be an efficient way to detect 99.8% errors and provide reliable results.

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