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Physical characterization of thin‐film solar cells

K. DuroseDepartment of Physics, University of Durham, South Road, Durham DH1 3LE, UKS. E. AsherNational Renewable Energy Laboratory, 1617 Cole Blvd. MS 3215, Golden, CO 80401-3393, USAWolfram JaegermannInstitute of Materials Science, Darmstadt University of Technology, Darmstadt, GermanyDean H. LeviNational Renewable Energy Laboratory, 1617 Cole Blvd. MS 3215, Golden, CO 80401-3393, USABrian E. McCandlessInstitute for Energy Conversion, University of Delaware, Newark, DE 19716, USAWyatt K. MetzgerNational Renewable Energy Laboratory, 1617 Cole Blvd. MS 3215, Golden, CO 80401-3393, USAHelio MoutinhoNational Renewable Energy Laboratory, 1617 Cole Blvd. MS 3215, Golden, CO 80401-3393, USAP.D. PaulsonInstitute for Energy Conversion, University of Delaware, Newark, DE 19716, USACraig L. PerkinsNational Renewable Energy Laboratory, 1617 Cole Blvd. MS 3215, Golden, CO 80401-3393, USAJames R. SitesPhysics Department, Colorado State University, Fort Collins, CO 80525, USAGlenn TeeterNational Renewable Energy Laboratory, 1617 Cole Blvd. MS 3215, Golden, CO 80401-3393, USAM. TerheggenETH Zürich, Institut für Angewandte Physik, CH-8093, Zürich, Switzerland

2004en

ABI

Annotatsiya

Abstract The principal techniques used in the physical characterization of thin‐film solar cells and materials are reviewed, these being scanning probe microscopy (SPM), X‐ray diffraction (XRD), spectroscopic ellipsometry, transmission electron microscopy (TEM), Auger electron spectroscopy (AES), secondary‐ion mass spectrometry (SIMS), X‐ray photoelectron spectroscopy (XPS), photoluminescence and time‐resolved photoluminescence (TRPL), electron‐beam‐induced current (EBIC) and light‐beam‐induced current (LBIC). For each method the particular applicability to thin‐film solar cells is highlighted. Examples of the use of each are given, these being drawn from the chalcopyrite, CdTe, Si and III–V materials systems. Copyright © 2004 John Wiley & Sons, Ltd.

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DOI: 10.1002/pip.542

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