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Appearance of negative resistance in p-n junction structures in a microwave field

Д. А. УсановSaratov State University, 410026, Saratov, RussiaА. В. СкрипальSaratov State University Saratov RussiaN. V. UgryumovaSaratov State University, 410026, Saratov, Russia
1998en
ABI

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The results of theoretical and experimental investigations of the appearance of negative differential resistance in p-n junction diode structures in the presence of a high level of microwave power are presented. The theoretical analysis of the influence of a high level of microwave power on the form of the current-voltage characteristic of a diode takes into account the variation of the constant component of the current flowing through the p-n structure due to the heating of the free charge carriers and the rectifier effect.

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