Appearance of negative resistance in p-n junction structures in a microwave field
Д. А. УсановSaratov State University, 410026, Saratov, RussiaА. В. СкрипальSaratov State University Saratov RussiaN. V. UgryumovaSaratov State University, 410026, Saratov, Russia
1998en
ABI
Annotatsiya
The results of theoretical and experimental investigations of the appearance of negative differential resistance in p-n junction diode structures in the presence of a high level of microwave power are presented. The theoretical analysis of the influence of a high level of microwave power on the form of the current-voltage characteristic of a diode takes into account the variation of the constant component of the current flowing through the p-n structure due to the heating of the free charge carriers and the rectifier effect.
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