Optical probing technique for inhomogeneous superconducting films
C. C.IBM Thomas J. Watson Research Center, P. O. Box 218, Yorktown Heights, New York 10598M. M. T. LoyIBM Thomas J. Watson Research Center, P. O. Box 218, Yorktown Heights, New York 10598D. C. CronemeyerIBM Thomas J. Watson Research Center, P. O. Box 218, Yorktown Heights, New York 10598
1982en
ABI
Annotatsiya
We report a nondestructive optical probing technique for superconducting films, by which a cross-sectional gradient of the local transition temperature Tc and a two-dimensional map of the local critical current Ic of an Al film were obtained. The two-dimensional map clearly shows a variety of defects of the Al film. Some of them can be correlated to visible pinholes.
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