Ushbu ishga iqtibos qilgan ishlar

2 ta ish

Ish: Theory of Enhanced Migration of Interstitial Aluminum in Silicon

1. New Tight-Binding Method for Simulation of Defect Configurations, Creation and Diffusion Mechanisms in Solids: Application to Silicon

   Zokirkhon M. Khakimov

   MaqolaThin-Film Transistor TechnologiesMRS Proceedings19980 iqtibos

   ABIABI:AkademIndex/openalex/1998.article.000275

2. New Tight-Binding Method for Simulation of Defect Configurations, Creation and Diffusion Mechanisms in Solids: Application to Silicon

   Zokirkhon M. Khakimov

   MaqolaSilicon and Solar Cell TechnologiesMRS Proceedings19980 iqtibos

   ABIABI:AkademIndex/openalex/1998.article.000320