Cyrian Leriche

1 works

Advanced Research Center for NanoLithography, University of Amsterdam, Science Park 106, 1098 XG Amsterdam, The Netherlands

1. The Surface-Topography Challenge: A Multi-Laboratory Benchmark Study to Advance the Characterization of Topography

   Asima Pradhan, Martin H. Müser, N. Miller +97

   ArticleSurface Roughness and Optical MeasurementsTribology Letters20250 citations

   ABIABI:AkademIndex/openalex/2025.article.000091