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On the theory of transient process after reversal of a p–i–n diode current from forward to reverse direction (I)

D. A. AronovS. V. Starodubtsev Physico-Technical Institute, Academy of Sciences of the Uzbekian SSRR. MamatkulovV. I. Lenin State University, Tashkent
physica status solidi (a)journal1972en
ABI

Abstract

Calculations are given related to the transient process of the reverse-resistance recovery after reversal of a p–i–n diode current from forward to reverse direction. The calculations have been performed for high-level forward injection with junction injection coefficients not equal to unity and considering the expansion of space-charge regions in pulling excess carriers out of the i-layer and heavily doped regions under the action of large reverse currents. By using Fourier series methods for the first (quasi-neutral) stage of the transient process, a general expression has been found for the carrier concentration distribution in the i-region. [Russian text ignored].

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