Article

Transverse focusing of electrons in the presence of plane defects terminating at the specimen surface

S. A. KorzhPhysicotechnical Institute of Low-Temperatures, Academy of Sciences of the Ukrainian SSR, Khar’kov

Soviet Journal of Low Temperature Physicsjournal1981en

ABI

Abstract

Transverse focusing of electrons by a magnetic field is analyzed for the case where the effective electrons interact with plane defects in the crystal lattice. It is demonstrated that the reflection and refraction characteristics of the twinning plane in a coherent twin can be determined from the temperature dependence of the amplitude of focusing peaks.

Topics

Electron and X-Ray Spectroscopy Techniques Integrated Circuits and Semiconductor Failure Analysis Advancements in Photolithography Techniques

Identifiers

DOI: 10.1063/10.0030567

Citations and references

Cited by 01 references

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