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Works cited by this work

12 works

Work: Effect of grain boundary scattering on the TCR of thin tin films

  1. The mean free path of electrons in metals

    E. H. Sondheimer

    Article19523 citations
    ABI

  2. Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External Surfaces

    A. F. Mayadas, M. Shatzkes

    Article19703 citations
    ABI

  3. Thin Film Phenomena

    K. L. Chopra, Julius Klerrer

    Article19702 citations
    ABI

  4. Statistical model of electrical conduction in polycrystalline metals

    C. R. Tellier, C.P. Pichard, A. J. Tosser

    Article19792 citations
    ABI

  5. A three-dimensional model for grain boundary resistivity in metal films

    C. R. Pichard, C. R. Tellier, A. J. Tosser

    Article19792 citations
    ABI

  6. Description of electronic transport properties of monocrystalline films by a statistical model

    C. R. Tellier, A. J. Tosser

    Article19802 citations
    ABI

  7. Untitled

    Other1 citations
    ABI

  8. Untitled

    Other1 citations
    ABI

  9. Untitled

    Other1 citations
    ABI

  10. Untitled

    Other1 citations
    ABI

  11. Untitled

    Other1 citations
    ABI

  12. Relationship of electrical resistance of polycrystalline tin films to structural characteristics

    Б. И. Белевцев, Yu. F. Komnik, V. E. Kopina +1

    ArticleCopper Interconnects and ReliabilitySoviet Journal of Low Temperature Physics19801 citations
    ABI