Investigation of the influence of residual stresses on the thermophysical and thermoelastic properties of silicon nitride ceramic by photothermal and photoacoustic methods
К. Л. МуратиковA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. PetersburgA. L. GlazovA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. PetersburgD. N. RoseA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. PetersburgJ. E. DumarA. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. Petersburg
ABI
Abstract
Photodeflection and photoreflection microscopy have been used to show that residual stresses do not influence the thermophysical parameters of silicon nitride ceramic. It was demonstrated that photoreflection microscopy can provide information on the thermophysical properties of ceramics at the level of individual grains. It was established that the theory of photoacoustic signal formation with a piezoelectric recording method based on the Murnaghan model with allowance for the stress dependence of the thermoelastic coupling coefficient can qualitatively explain these experimental data and can be used to estimate the thermoelastic parameters of the ceramic.
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