Article

Light-Induced Degradation Effects in a-Si:H Observed by Raman Scattering Measurements

Paul StradinsThin Film Silicon Solar Cells Super Laboratory, Electrotechnical Laboratory, Tsukuba, Ibaraki, 305-8568, JapanMichio KondoThin Film Silicon Solar Cells Super Laboratory, Electrotechnical Laboratory, Tsukuba, Ibaraki, 305-8568, JapanNobuhiro HataThin Film Silicon Solar Cells Super Laboratory, Electrotechnical Laboratory, Tsukuba, Ibaraki, 305-8568, JapanAkihisa MatsudaThin Film Silicon Solar Cells Super Laboratory, Electrotechnical Laboratory, Tsukuba, Ibaraki, 305-8568, Japan

MRS Proceedingsjournal1998en

ABI

Abstract

No abstract available.

Topics

Thin-Film Transistor Technologies Silicon and Solar Cell Technologies Silicon Nanostructures and Photoluminescence

Identifiers

DOI: 10.1557/proc-507-723

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