Structural and Morphological Characterization of Al/Ti-Based Ohmic Contacts on p-Type 4H-SiC Annealed Under Various Conditions
Konstantin VassilevskiNewcastle UniversityKonstantinos ZekentesFoundation for Research and Technology-Hellas(FORTH)George KonstantinidisN. A. PapanicolaouNaval Research LaboratoryIrina P. NikitinaNewcastle UniversityA.I. BabaninIoffe Physicotechnical Institute RAS
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