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SiC X-Ray Detectors for Spectroscopy and Imaging over a Wide Temperature Range

G. BertuccioNational Institute of Nuclear Physics INFNR. CasiraghiE. GattiPolitecnico di MilanoD. MaiocchiPolitecnico di MilanoF. NavaUniversity of Modena and Reggio EmiliaC. CanaliUniversity of ModenaA. CetronioSELEX Sistemi Integrati S.p.AC. LanzieriSELEX Sistemi Integrati S.p.A
Materials science forumbook series2003en
ABI

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