Influence of Extended Structural Defects on the Characteristics of Electroluminescence in Efficient Silicon Light-Emitting Diodes
Н. А. СоболевRussian Academy of SciencesA. M. Emel’yanovIoffe Physicotechnical Institute RASE. I. ShekRussian Academy of SciencesV. I. VdovinInstitute for Chemical Problems of Microelectronics
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomenabook series2003en
ABI
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