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Article

Investigation of γ-radiation defect formation at the Si-SiO 2 interface

S.Z. ZaynabidinovSh. Kh. YulchievР. АлиевAndijan State University Andijan Uzbekistan
2004en
ABI

Abstract

No abstract available.

Topics

Integrated Circuits and Semiconductor Failure AnalysisSilicon and Solar Cell TechnologiesIon-surface interactions and analysis

Citations and references

Cited by 00 references
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