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Morphology, structure, and electrical properties of YBa2Cu3Ox thin films on tilted NdGaO3 substrates, deposited by DC-sputtering

Peter B. MozhaevInstitute of Radio Engineering and Electronics RAS, Moscow 125009, RussiaI.M. KotelyanskiiInstitute of Radio Engineering and Electronics RAS, Moscow 125009, RussiaВ. А. ЛузановInstitute of Radio Engineering and Electronics RAS, Moscow 125009, RussiaJulia E. MozhaevaInstitute of Radio Engineering and Electronics RAS, Moscow 125009, RussiaT. DonchevInstitute of Electronics BAS, Sofia, BulgariaE. MateevInstitute of Electronics BAS, Sofia, BulgariaTimur NurgalievInstitute of Electronics BAS, Sofia, BulgariaIgor BdikinDepartment of Ceramic and Glass Engineering, CICECO, University of Aveiro, Aveiro 3810-193, PortugalB.Zh. NarymbetovComplex Institute of Natural Sciences UzAS, Nukus, Uzbekistan
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