Raman spectroscopy of the interface between a thin nanostructured ZnO film and fullerene C60
Э. А. ЗахидовInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of Uzbekistan, Tashkent, 100125, UzbekistanM. A. ZakhidovaInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of Uzbekistan, Tashkent, 100125, UzbekistanА. М. КоххаровInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of Uzbekistan, Tashkent, 100125, UzbekistanSherzod NematovInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of Uzbekistan, Tashkent, 100125, UzbekistanР. А. НусретовInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of Uzbekistan, Tashkent, 100125, UzbekistanVakhobjon KuvondikovInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of Uzbekistan, Tashkent, 100125, UzbekistanAziz SaparbaevInstitute of Ion-Plasma and Laser Technologies, Academy of Sciences of Uzbekistan, Tashkent, 100125, Uzbekistan
ABI
Abstract
The resonance and nonresonance Raman scattering in the interface between a thin ZnO film with a well-developed nanostructured surface morphology and a layer of fullerene C60 molecules deposited on this film has been investigated. It is shown that the intensity of the interaction between the C60 molecules and ZnO film surface can be estimated based on the spectral scattering characteristics.
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