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NICKEL-RELATED COMPLEX DEFECTS IN SILICON

Sayfillo Saidovich NasriddinovNational University of UzbekistanDaryabay Muratbaevich EsbergenovNational University of UzbekistanElmira M. NaurzalievaNational University of Uzbekistan
European Science Reviewjournal2021en
ABI

Abstract

No abstract available.

Topics

Silicon Nanostructures and Photoluminescence

Identifiers

DOI
10.29013/esr-21-7.8-6-8

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Cited by 00 references
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