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Mechanisms of spectral analysis of polycrystalline PbTe films by the Romanovsky method and spectroscopy analysis

Salim OtajonovFergana State University, Fergana, UzbekistanM. M. KhalilovFergana branch of Tashkent University of Information Technologies named after Mukhammad al-Khwarizmi, Fergana, UzbekistanOdinakhon RayimdjanovaFergana branch of Tashkent University of Information Technologies named after Mukhammad al-Khwarizmi, Fergana, UzbekistanNurmakhamad JuraevFergana branch of Tashkent University of Information Technologies named after Mukhammad al-Khwarizmi, Fergana, UzbekistanBahrom DjalilovFergana branch of Tashkent University of Information Technologies named after Mukhammad al-Khwarizmi, Fergana, Uzbekistan
AIP conference proceedingsjournal2025en
ABI

Abstract

No abstract available.

Topics

Chalcogenide Semiconductor Thin FilmsAdvanced Semiconductor Detectors and MaterialsAdvanced Thermoelectric Materials and Devices

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DOI
10.1063/5.0269591

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Cited by 010 references
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