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Design of Self-Checking Discrete Devices Based on Boolean Signals Correction and Composition of Constant-Weight Codes “1-Out-of-4” and “3-Out-of-4”

Д.В. ЕфановPeter the Great Saint Petersburg Polytechnic University, Saint Petersburg, RussiaY. I. YelinaPeter the Great Saint Petersburg Polytechnic University, Saint Petersburg, RussiaSunnatillo T. BoltayevTashkent State Transport University, Tashkent, UzbekistanNazirjan M. AripovTashkent State Transport University, Tashkent, UzbekistanAsadulla R. AzizovTashkent State Transport University, Tashkent, UzbekistanElnara AmetovaTashkent State Transport University, Tashkent, UzbekistanSokhibjamol I. ValievTashkent State Transport University, Tashkent, Uzbekistan
IEEE Accessjournal2026en
ABI

Abstract

In the design of self-checking discrete devices, the main tasks are to achieve the smallest structural redundancy of the concurrent error-detection circuits and to ensure the checkability of all their components. Practice shows that it is not always possible to achieve this using traditional methods of designing concurrent error-detection circuits, based on duplication and control of calculations using code methods. The authors of the paper propose a method for modifying constant-weight codes, which allows achieving special properties of the designed structures of self-checking devices. In the course of our research, we used methods of discrete mathematics and technical diagnostics for the development and justification of new approaches to designing self-checking discrete devices. We have proposed methods for designing concurrent error-detection circuits based on Boolean signals correction and the composition of constant-weight codes “1-out-of-4” and “3-out-of-4”. These methods allow designing a large number of concurrent error-detection circuits, among which the most effective ones in terms of structural redundancy can be selected. In addition, by minimizing the number of signal correction elements in the concurrent error-detection circuit, the solution to the problem of ensuring complete self-checking of the concurrent error-detection circuit structures is simplified. Experimental results confirm the theoretical prerequisites for improving the methods of organizing concurrent error-detection circuits based on the methods proposed by the authors of the paper. Our proposed solutions can be effectively used in practice in the design of self-checking discrete devices based on any element base.

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