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Work: The Influence of Temperature and Electron Irradiation on the Surface Morphology and Structural State of Oxygen-Containing Silicon

  1. A profile refinement method for nuclear and magnetic structures

    H. M. Rietveld

    Article196925 citations
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  2. The Scherrer Formula for X-Ray Particle Size Determination

    A. L. Patterson

    Article193913 citations
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