Works cited by this work

6 works

Work: Electronic structure and optical properties of CaF2 films under low energy Ba+ ion-implantation combined with annealing

1. Silicides for VLSI applications

   S. P. Murarka

   Book19836 citations

   ABIABI:AkademIndex/openalex/2026.other.212580

2. Ion Implantation in Semiconductors

   James W. Mayer, O. J. Marsh

   Chapter19695 citations

   ABIABI:AkademIndex/openalex/2026.other.212581

3. Auger electron spectroscopy and electron energy loss spectroscopy studies of the formation of silicon nitride by implanting low energy nitrogen ions into silicon

   N. Lieske, Rudolf Hezel

   Article19813 citations

   ABIABI:AkademIndex/openalex/2026.other.212584

4. Special Applications

   S. P. Murarka

   Chapter19833 citations

   ABIABI:AkademIndex/openalex/2026.other.212585

5. Untitled

   Other1 citations

   ABIABI:AkademIndex/openalex/2026.other.212582

6. Untitled

   Other1 citations

   ABIABI:AkademIndex/openalex/2026.other.212583