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Works citing this work

11 works

Work: Computer Simulation of Scattering Xe<sup>+</sup> Ions from InP(001)❬110❭ Surface at Grazing Incidence

  1. Comparison of electron irradiation on the formation of surface defects in situ and post thin-film LiF/Si(111) deposition

    U. B. Sharopov, Kulwinder Kaur, М. К. Курбанов +4

    ArticleSemiconductor materials and devicesThin Solid Films202113 citations
    ABI

  2. Controlling the Low-temperature Ionic Purification of a Silicon Surface by Electron Spectroscopy

    U. B. Sharopov, Kulwinder Kaur, М. К. Курбанов +3

    ArticleIon-surface interactions and analysisSilicon202111 citations
    ABI

  3. Formation of defects on the surface of LiF crystals under irradiation with different ions mass

    Utkirjon Sharopov, Umid Gopparov, K. Yu. Rashidov +8

    ArticleIon-surface interactions and analysisRadiation effects and defects in solids20229 citations
    ABI

  4. Angular Distributions of Scattered Ne and Ar Ions at the Grazing Incidence on the InGaP (001) 110 Surface

    М. K. Kаrimov, Uchkun Kutliev, Kamola Otabaeva +1

    ArticleRadiation Detection and Scintillator TechnologiesJournal of Nano- and Electronic Physics20206 citations
    ABI

  5. Influence of the irradiation of ions of different mass on the formation of surface defects of lithium fluoride thin films

    Utkirjon Sharopov, Kulwinder Kaur, М. К. Курбанов +5

    ArticleIon-surface interactions and analysisSurface and Interface Analysis20226 citations
    ABI

  6. Analysis of InGaP(001) surface by the low energy ion scattering spectroscopy

    Uchkun Kutliev, М. K. Kаrimov, F.O. Kuryozov +1

    ArticleIon-surface interactions and analysisJournal of Physics Conference Series20214 citations
    ABI

  7. Controlling the Low-Temperature Ionic Purification of a Silicon Surface by Electron Spectroscopy

    U. B. Sharopov, Kulwinder Kaur, М. К. Курбанов +3

    PreprintSemiconductor materials and devicesResearch Square20211 citations
    ABI

  8. Inelastic energy loss of Ar ions scattered Al2O3 surface under grazing incidence

    Atabek S. Ashirov, Muzaffar Qurbanov, I.U. Tangribergenov +2

    ArticleIon-surface interactions and analysisPhysics and Chemistry of Solid State20211 citations
    ABI

  9. Computer Simulation of Adsorption of Fullerene on Graphene

    Abror Ulukmuradov, I.D. Yadgarov, V. G. Stel’makh +1

    ArticleFullerene Chemistry and ApplicationsJournal of Nano- and Electronic Physics20210 citations
    ABI

  10. Doping of Silicon with Gadolinium Atoms – Structural Distribution and Raman Spectral Changes

    Sharifa B. Utamuradova, Shakhrukh Kh. Daliev, Jonibek J. Khamdamov +3

    ArticleIon-surface interactions and analysisEast European Journal of Physics20250 citations
    ABI

  11. Study of the Formation of Low-Dimensional Defect States in Single-Crystal Silicon with the Participation of Oxygen

    Akramjon Y. Boboev, Biloliddin M. Ergashev, Nuritdin Y. Yunusaliyev +1

    ArticleSilicon and Solar Cell TechnologiesEast European Journal of Physics20250 citations
    ABI