← Back to work
Works cited by this work
23 works
Work: Defect Structure of Silicon Doped with Erbium
Determining the material structure of microcrystalline silicon from Raman spectra
C. Smit, R.A.C.M.M. van Swaaij, H. Donker +3
Article20034 citationsABIRaman spectroscopy of PtSi formation at the Pt/Si(100) interface
J. C. Tsang, Y. Yokota, R. Matz +1
Article19844 citationsABIElectrophysical properties of silicon doped with lutetium
Sh.Kh. Daliev, Sharifa B. Utamuradova
Article20244 citationsABIOne and two-phonon Raman scattering from nanostructured silicon
Igor Iatsunskyi, Grzegorz Nowaczyk, Stefan Jurga +3
Article20153 citationsABIResonant Raman scattering of a single layer of Si nanocrystals on a silicon substrate
A. Wellner, Vincent Paillard, H. Coffin +2
Article20043 citationsABIRaman Spectra of Amorphous Si and Related Tetrahedrally Bonded Semiconductors
J.E. Smith, M. H. Brodsky, B. L. Crowder +2
Article19713 citationsABICritical-point analysis of the two-phonon Raman spectrum of silicon
K. Uchinokura, Tomoyuki Sekine, E. Matsuura
Article19743 citationsABIInitial Phase formation at the Interface of Ni, Pd, or Pt and Si
R. J. Nemanich, Chia-Lun Tsai, B. Stafford +2
Article19832 citationsABI