Works citing this work

3 works

Work: Secondary Ion Mass Spectrometry

1. High non-additive sputtering of silicon as large positive cluster ions under polyatomic ion bombardment

   S.F. Belykh, У. Х. Расулев, A.V. Samartsev +2

   ArticleIon-surface interactions and analysisVacuum20009 citations

   ABIABI:AkademIndex/openalex/2026.other.415069

2. Comparative study of kinetic energy spectra and mass distributions of Ta+ ions sputtered from tantalum by atomic and molecular ion bombardment

   S.F. Belykh, У. Х. Расулев, A.V. Samartsev +1

   ArticleIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms19988 citations

   ABIABI:AkademIndex/openalex/2026.other.426045

3. Sputtering of Tantalum by Atomic and Molecular Gold Ions: Comparative Study of Yields and Kinetic Energy Distributions of Atomic and Cluster Ions

   S.F. Belykh, У. Х. Расулев, A.V. Samartsev +2

   ChapterIon-surface interactions and analysis19982 citations

   ABIABI:AkademIndex/openalex/2026.other.426042