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Works citing this work
1 works
Current Analysis of Ion Implanted p<sup>+</sup>/n 4H-SiC Junctions: Post-Implantation Annealing in Ar Ambient
Roberta Nipoti
,
Fabio Bergamini
,
F. Moscatelli
+3
Article
Silicon Carbide Semiconductor Technologies
Materials science forum
2006
0 citations
ABI
ABI:AkademIndex/openalex/2006.article.000136