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Works citing this work
1 works
Effect of grain boundary scattering on the TCR of thin tin films
C. R. Pichard
,
Yu. F. Komnik
,
Б. И. Белевцев
+1
Article
Copper Interconnects and Reliability
Journal of Materials Science Letters
1983
0 citations
ABI
ABI:AkademIndex/openalex/1983.article.000029