Works citing this work

3 works

Work: Barrier to Migration of the Silicon Self-Interstitial

1. New Tight-Binding Method for Simulation of Defect Configurations, Creation and Diffusion Mechanisms in Solids: Application to Silicon

   Zokirkhon M. Khakimov

   ArticleThin-Film Transistor TechnologiesMRS Proceedings19980 citations

   ABIABI:AkademIndex/openalex/1998.article.000275

2. New Tight-Binding Method for Simulation of Defect Configurations, Creation and Diffusion Mechanisms in Solids: Application to Silicon

   Zokirkhon M. Khakimov

   ArticleSilicon and Solar Cell TechnologiesMRS Proceedings19980 citations

   ABIABI:AkademIndex/openalex/1998.article.000320

3. Formation of radiation defects in silicon structures under low-intensity electron irradiation

   Sh. Makhkamov, N.A. Tursunov, M. Ashurov +2

   ArticleSemiconductor materials and interfacesSemiconductor Science and Technology20010 citations

   ABIABI:AkademIndex/openalex/2001.article.000146