Works citing this work

3 works

Work: Depth Profiling of 4-Acetamindophenol-Doped Poly(lactic acid) Films Using Cluster Secondary Ion Mass Spectrometry

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   ABIABI:AkademIndex/openalex/2026.other.415077

2. Secondary ion emission from bismuth under bombardment with Bi− m and Au− m cluster ions

   С. Н. Морозов, У. Х. Расулев

   ArticleIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20080 citations

   ABIABI:AkademIndex/openalex/2008.article.000234

3. SIMS of silicon bombarded with Sb+ m cluster ions

   С. Н. Морозов, У. Х. Расулев

   ArticleIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20140 citations

   ABIABI:AkademIndex/openalex/2014.article.000619