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С. Н. Морозов

26 works

Arifov Institute of Electronics, Akademgorodok, 700125 Tashkent, Uzbekistan

  1. Features of polyatomic ion emission under sputtering of a silicon single crystal by Au− cluster ions

    Sh.Dj. Akhunov, С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200313 citations
    ABI

  2. Thermal spikes observed during the tantalum sputtering by gold cluster ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisTechnical Physics Letters200312 citations
    ABI

  3. Comparative study of polyatomic secondary ion emission from silicon with <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si11.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Au</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si12.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Si</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si13.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>C</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> projectiles

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200611 citations
    ABI

  4. Non-additive effects in secondary-ion emission from V, Nb and Ta under gold-cluster bombardment

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisApplied Surface Science200411 citations
    ABI

  5. Emission of quasi-thermal ions from a solid bombarded by cluster ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisTechnical Physics20097 citations
    ABI

  6. Non-linear effects in Ta sputtering by Au− ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms20036 citations
    ABI

  7. Sputtering source of cluster ions and surface-ionization source of polyatomic ions of organic compounds

    У. Х. Расулев, С. Н. Морозов, У. Хасанов +1

    ArticleIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms20065 citations
    ABI

  8. Secondary ion emission under the bombardment of Si by multiply charged Si q+ ions

    С. Н. Морозов

    ArticleIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20122 citations
    ABI

  9. Indium sputtering upon bombardment with cluster ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20122 citations
    ABI

  10. Secondary ion emission from a GaAs single crystal upon bombardment with Bi+ m cluster ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20162 citations
    ABI

  11. The formation of excited states of sputtered yttrium atoms

    С. Н. Морозов, E. Vasileva

    ArticleIon-surface interactions and analysisOptics and Spectroscopy20001 citations
    ABI

  12. Investigation of the silicon ion density during molecular beam epitaxy growth

    G. Eifler, E. Kasper, Х. Б. Ашуров +1

    ArticleSemiconductor materials and devicesJournal of Vacuum Science & Technology A Vacuum Surfaces and Films20021 citations
    ABI

  13. Cluster projectile ions used for the SIMS analysis of silicon

    Sh.Dj. Akhunov, С. Н. Морозов

    ArticleIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20131 citations
    ABI

  14. A surface‐ionization method of detection of a neutral component of indium sputtering under bombardment by cluster ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisSurface and Interface Analysis20121 citations
    ABI

  15. Comparison of the excitation of rare-earth metals in sputtering, ion- and electron-atom collisions

    E.K. Vasiljeva, С. Н. Морозов

    ArticleAtomic and Molecular PhysicsNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms19921 citations
    ABI

  16. Experimental study of the excited state formation of holmium atoms under ion sputtering, electron and ion-atom collisions

    E.K. Vasiljeva, С. Н. Морозов

    ArticleIon-surface interactions and analysisVacuum19931 citations
    ABI

  17. The study of the spectra of ion-photon emission during sputtering of Sc-target

    С. Н. Морозов

    ArticleNuclear Physics and Applications19990 citations
    ABI

  18. Characterisation of the generation of ions in electron beam evaporator for the control of metal deposition processes

    A. Lyutovich, Karl Maile, A. Gusko +2

    Articlenanoparticles nucleation surface interactionsSurface and Coatings Technology20020 citations
    ABI

  19. SIMS analyses with cluster ions used as bombarding and analyzed particles

    У. Х. Расулев, С. Н. Морозов

    ArticleIon-surface interactions and analysisIzvestiya Akademii Nauk. Rossijskaya Akademiya Nauk. Seriya Fizicheskaya20020 citations
    ABI

  20. Secondary ion emission from bismuth under bombardment with Bi− m and Au− m cluster ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20080 citations
    ABI

  21. Non-additive effects of secondary ion emission under interaction of cluster ions with solid surface

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysis20100 citations
    ABI

  22. Application of the surface ionization for the detection of secondary particles in the secondary-ion mass spectrometry (SIMS)

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisTechnical Physics20130 citations
    ABI

  23. Cluster-SIMS-cluster mode study with Bi m and Au m projectiles

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisUzbekiston Fizika Zhurnali20130 citations
    ABI

  24. Secondary ion emission under bombardment of GaAs monocrystal by molecular ions of copper phthalocyanine

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysis20140 citations
    ABI

  25. SIMS of silicon bombarded with Sb+ m cluster ions

    С. Н. Морозов, У. Х. Расулев

    ArticleIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20140 citations
    ABI