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С. Н. Морозов

Работ: 26

Arifov Institute of Electronics, Akademgorodok, 700125 Tashkent, Uzbekistan

  1. Features of polyatomic ion emission under sputtering of a silicon single crystal by Au− cluster ions

    Sh.Dj. Akhunov, С. Н. Морозов, У. Х. Расулев

    СтатьяIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms2003Цитирований: 13
    ABI

  2. Thermal spikes observed during the tantalum sputtering by gold cluster ions

    С. Н. Морозов, У. Х. Расулев

    СтатьяIon-surface interactions and analysisTechnical Physics Letters2003Цитирований: 12
    ABI

  3. Comparative study of polyatomic secondary ion emission from silicon with <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si11.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Au</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si12.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Si</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si13.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>C</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> projectiles

    С. Н. Морозов, У. Х. Расулев

    СтатьяIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms2006Цитирований: 11
    ABI

  4. Non-additive effects in secondary-ion emission from V, Nb and Ta under gold-cluster bombardment

    С. Н. Морозов, У. Х. Расулев

    СтатьяIon-surface interactions and analysisApplied Surface Science2004Цитирований: 11
    ABI

  5. Emission of quasi-thermal ions from a solid bombarded by cluster ions

    С. Н. Морозов, У. Х. Расулев

    СтатьяIon-surface interactions and analysisTechnical Physics2009Цитирований: 7
    ABI

  6. Non-linear effects in Ta sputtering by Au− ions

    С. Н. Морозов, У. Х. Расулев

    СтатьяIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms2003Цитирований: 6
    ABI

  7. Sputtering source of cluster ions and surface-ionization source of polyatomic ions of organic compounds

    У. Х. Расулев, С. Н. Морозов, У. Хасанов +1

    СтатьяIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms2006Цитирований: 5
    ABI

  8. Secondary ion emission under the bombardment of Si by multiply charged Si q+ ions

    С. Н. Морозов

    СтатьяIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2012Цитирований: 2
    ABI

  9. Indium sputtering upon bombardment with cluster ions

    С. Н. Морозов, У. Х. Расулев

    СтатьяIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics2012Цитирований: 2
    ABI

  10. Secondary ion emission from a GaAs single crystal upon bombardment with Bi+ m cluster ions

    С. Н. Морозов, У. Х. Расулев

    СтатьяIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics2016Цитирований: 2
    ABI

  11. The formation of excited states of sputtered yttrium atoms

    С. Н. Морозов, E. Vasileva

    СтатьяIon-surface interactions and analysisOptics and Spectroscopy2000Цитирований: 1
    ABI

  12. Investigation of the silicon ion density during molecular beam epitaxy growth

    G. Eifler, E. Kasper, Х. Б. Ашуров +1

    СтатьяSemiconductor materials and devicesJournal of Vacuum Science & Technology A Vacuum Surfaces and Films2002Цитирований: 1
    ABI

  13. Cluster projectile ions used for the SIMS analysis of silicon

    Sh.Dj. Akhunov, С. Н. Морозов

    СтатьяIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques2013Цитирований: 1
    ABI

  14. A surface‐ionization method of detection of a neutral component of indium sputtering under bombardment by cluster ions

    С. Н. Морозов, У. Х. Расулев

    СтатьяIon-surface interactions and analysisSurface and Interface Analysis2012Цитирований: 1
    ABI

  15. Comparison of the excitation of rare-earth metals in sputtering, ion- and electron-atom collisions

    E.K. Vasiljeva, С. Н. Морозов

    СтатьяAtomic and Molecular PhysicsNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms1992Цитирований: 1
    ABI

  16. Experimental study of the excited state formation of holmium atoms under ion sputtering, electron and ion-atom collisions

    E.K. Vasiljeva, С. Н. Морозов

    СтатьяIon-surface interactions and analysisVacuum1993Цитирований: 1
    ABI

  17. The study of the spectra of ion-photon emission during sputtering of Sc-target

    С. Н. Морозов

    СтатьяNuclear Physics and Applications1999Цитирований: 0
    ABI

  18. Characterisation of the generation of ions in electron beam evaporator for the control of metal deposition processes

    A. Lyutovich, Karl Maile, A. Gusko +2

    Статьяnanoparticles nucleation surface interactionsSurface and Coatings Technology2002Цитирований: 0
    ABI

  19. SIMS analyses with cluster ions used as bombarding and analyzed particles

    У. Х. Расулев, С. Н. Морозов

    СтатьяIon-surface interactions and analysisIzvestiya Akademii Nauk. Rossijskaya Akademiya Nauk. Seriya Fizicheskaya2002Цитирований: 0
    ABI

  20. Secondary ion emission from bismuth under bombardment with Bi− m and Au− m cluster ions

    С. Н. Морозов, У. Х. Расулев

    СтатьяIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics2008Цитирований: 0
    ABI

  21. Non-additive effects of secondary ion emission under interaction of cluster ions with solid surface

    С. Н. Морозов, У. Х. Расулев

    СтатьяIon-surface interactions and analysis2010Цитирований: 0
    ABI

  22. Application of the surface ionization for the detection of secondary particles in the secondary-ion mass spectrometry (SIMS)

    С. Н. Морозов, У. Х. Расулев

    СтатьяIon-surface interactions and analysisTechnical Physics2013Цитирований: 0
    ABI

  23. Cluster-SIMS-cluster mode study with Bi m and Au m projectiles

    С. Н. Морозов, У. Х. Расулев

    СтатьяIon-surface interactions and analysisUzbekiston Fizika Zhurnali2013Цитирований: 0
    ABI

  24. Secondary ion emission under bombardment of GaAs monocrystal by molecular ions of copper phthalocyanine

    С. Н. Морозов, У. Х. Расулев

    СтатьяIon-surface interactions and analysis2014Цитирований: 0
    ABI

  25. SIMS of silicon bombarded with Sb+ m cluster ions

    С. Н. Морозов, У. Х. Расулев

    СтатьяIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics2014Цитирований: 0
    ABI