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SIMS analyses with cluster ions used as bombarding and analyzed particles

У. Х. РасулевС. Н. МорозовInst. Ehlektroniki im. U.A. Arifova Akademii Nauk Respubliki Uzbekistan, Tashkent (Uzbekistan)
Izvestiya Akademii Nauk. Rossijskaya Akademiya Nauk. Seriya Fizicheskayajournal2002en
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Topics

Ion-surface interactions and analysisLaser-induced spectroscopy and plasmaAnalytical chemistry methods development

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