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С. Н. Морозов

26 та иш

Arifov Institute of Electronics, Akademgorodok, 700125 Tashkent, Uzbekistan

  1. Features of polyatomic ion emission under sputtering of a silicon single crystal by Au− cluster ions

    Sh.Dj. Akhunov, С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200313 иқтибос
    ABI

  2. Thermal spikes observed during the tantalum sputtering by gold cluster ions

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisTechnical Physics Letters200312 иқтибос
    ABI

  3. Comparative study of polyatomic secondary ion emission from silicon with <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si11.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Au</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math>, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si12.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>Si</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si13.gif" overflow="scroll"><mml:mrow><mml:msubsup><mml:mrow><mml:mtext>C</mml:mtext></mml:mrow><mml:mrow><mml:mi>m</mml:mi></mml:mrow><mml:mrow><mml:mo>-</mml:mo></mml:mrow></mml:msubsup></mml:mrow></mml:math> projectiles

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms200611 иқтибос
    ABI

  4. Non-additive effects in secondary-ion emission from V, Nb and Ta under gold-cluster bombardment

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisApplied Surface Science200411 иқтибос
    ABI

  5. Emission of quasi-thermal ions from a solid bombarded by cluster ions

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisTechnical Physics20097 иқтибос
    ABI

  6. Non-linear effects in Ta sputtering by Au− ions

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms20036 иқтибос
    ABI

  7. Sputtering source of cluster ions and surface-ionization source of polyatomic ions of organic compounds

    У. Х. Расулев, С. Н. Морозов, У. Хасанов +1

    МақолаIon-surface interactions and analysisNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms20065 иқтибос
    ABI

  8. Secondary ion emission under the bombardment of Si by multiply charged Si q+ ions

    С. Н. Морозов

    МақолаIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20122 иқтибос
    ABI

  9. Indium sputtering upon bombardment with cluster ions

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20122 иқтибос
    ABI

  10. Secondary ion emission from a GaAs single crystal upon bombardment with Bi+ m cluster ions

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20162 иқтибос
    ABI

  11. The formation of excited states of sputtered yttrium atoms

    С. Н. Морозов, E. Vasileva

    МақолаIon-surface interactions and analysisOptics and Spectroscopy20001 иқтибос
    ABI

  12. Investigation of the silicon ion density during molecular beam epitaxy growth

    G. Eifler, E. Kasper, Х. Б. Ашуров +1

    МақолаSemiconductor materials and devicesJournal of Vacuum Science & Technology A Vacuum Surfaces and Films20021 иқтибос
    ABI

  13. Cluster projectile ions used for the SIMS analysis of silicon

    Sh.Dj. Akhunov, С. Н. Морозов

    МақолаIon-surface interactions and analysisJournal of Surface Investigation X-ray Synchrotron and Neutron Techniques20131 иқтибос
    ABI

  14. A surface‐ionization method of detection of a neutral component of indium sputtering under bombardment by cluster ions

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisSurface and Interface Analysis20121 иқтибос
    ABI

  15. Comparison of the excitation of rare-earth metals in sputtering, ion- and electron-atom collisions

    E.K. Vasiljeva, С. Н. Морозов

    МақолаAtomic and Molecular PhysicsNuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms19921 иқтибос
    ABI

  16. Experimental study of the excited state formation of holmium atoms under ion sputtering, electron and ion-atom collisions

    E.K. Vasiljeva, С. Н. Морозов

    МақолаIon-surface interactions and analysisVacuum19931 иқтибос
    ABI

  17. The study of the spectra of ion-photon emission during sputtering of Sc-target

    С. Н. Морозов

    МақолаNuclear Physics and Applications19990 иқтибос
    ABI

  18. Characterisation of the generation of ions in electron beam evaporator for the control of metal deposition processes

    A. Lyutovich, Karl Maile, A. Gusko +2

    Мақолаnanoparticles nucleation surface interactionsSurface and Coatings Technology20020 иқтибос
    ABI

  19. SIMS analyses with cluster ions used as bombarding and analyzed particles

    У. Х. Расулев, С. Н. Морозов

    МақолаIon-surface interactions and analysisIzvestiya Akademii Nauk. Rossijskaya Akademiya Nauk. Seriya Fizicheskaya20020 иқтибос
    ABI

  20. Secondary ion emission from bismuth under bombardment with Bi− m and Au− m cluster ions

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20080 иқтибос
    ABI

  21. Non-additive effects of secondary ion emission under interaction of cluster ions with solid surface

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysis20100 иқтибос
    ABI

  22. Application of the surface ionization for the detection of secondary particles in the secondary-ion mass spectrometry (SIMS)

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisTechnical Physics20130 иқтибос
    ABI

  23. Cluster-SIMS-cluster mode study with Bi m and Au m projectiles

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisUzbekiston Fizika Zhurnali20130 иқтибос
    ABI

  24. Secondary ion emission under bombardment of GaAs monocrystal by molecular ions of copper phthalocyanine

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysis20140 иқтибос
    ABI

  25. SIMS of silicon bombarded with Sb+ m cluster ions

    С. Н. Морозов, У. Х. Расулев

    МақолаIon-surface interactions and analysisBulletin of the Russian Academy of Sciences Physics20140 иқтибос
    ABI