М. Е. Бойко

Работ: 1

A.F. Ioffe Physicotechnical Institute RAS

1. Advantages in the Small-Angle Scattering of X-Ray for Studying Optoelectronic Devices within the Frames of ISTC Projects

   М. Е. Бойко, Andrei M. Boiko

   СтатьяElectron and X-Ray Spectroscopy TechniquesKey engineering materials2010Цитирований: 0

   ABIABI:AkademIndex/openalex/2010.article.000271