Devices and Methods of Measurements
Работ: 3
Журнал · ISSN 2220-9506
Disordered Tin Oxide Films for Thermoelectric Applications: Correlation between Microstructure, Electrical Conductivity and Seebeck Coefficient
V.K. Ksenevich, V.A. Dorosinets, M. V. Samarina +4
СтатьяAdvanced Thermoelectric Materials and DevicesDevices and Methods of Measurements2025Цитирований: 0ABI