Low-temperature yield stress anomaly in single-crystal silver

Temperature dependence of the yield point τ0(T) was studied in single crystals of 99.9%-pure silver within the range 1.6–77.3 °K. An anomaly was discovered which consists of a maximum and minimum appearing on the curve for this dependence. A theoretical explanation is offered for the anomalous dependence τ0(T), based on the assumption of two types of restraint on the migration of dislocation in crystals: thermogenic restraint caused by thermal fluctuation and athermogenic hindrances which are intrinsic in crystals or arise through other mechanisms than thermal activation. A computer-assisted comparison of theoretically derived τ0(T) with the experimentally obtained dependence shows satisfactory agreement.

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