Radiation effect on the electrophysical properties of some oxide dielectric materials

The radiation effect on the electrophysical properties of oxide dielectric materials is studied depending on the absorbed dose and temperature. Radiation thermal effects are traced in aluminum and silicon oxides (α-Al2O3, α-SiO2) and ceramics based on them. Regularities of changes in their physical properties under the action of a number of external factors are found. Possible mechanisms of conductivity and charge transfer are discussed within the known models. The natures of dielectric-absorption-induced maxima and surface current are considered, along with the factors determining the degree of modification of the electrophysical properties of different types of oxide materials.

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