Статья

INFLUENCE OF REFLECTION OF PHOTOELECTRONS FROM THE SURFACE PHOTO-EMF IN THIN SEMICONDUCTOR FILMS AND COMPARE IT WITH THE BULK PHOTO-EMF

G. GulyamsNamangan Engineering-Pedagogical Institute 12 Dustlik ave., Namangan, 160103, Republic of UzbekistanM. G. DadamirzayevNamangan Engineering-Pedagogical Institute 12 Dustlik ave., Namangan, 160103, Republic of UzbekistanN. Yu. SharibaevNamangan Engineering-Technological Institute 7 Kasanay str., Namangan, 160115, Republic of Uzbekistan

Alternative Energy and Ecology (ISJAEE)journal2016en

ABI

Аннотация

The influence of the reflection of photoelectrons from the surface photo-EMF in thin semiconductor films and compare it with the bulk photo-EMF. It is shown that the reflected photovoltage can prevail over the bulk of the electromotive force only in samples with a large mean free path with a strong absorption of light. In thin films reflected the photo-EMF, apparently observed with other types of photo-EMF and the interpretation of the experimental results can be interpreted as the volume electromotive force.

Темы

Advanced MEMS and NEMS Technologies Mechanical and Optical Resonators Chemical and Physical Properties of Materials

Идентификаторы

DOI: 10.15518/isjaee.2015.21.002

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Показатели — AkademScholar · Скоро