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Работ: 1

Работа: Study of Ion Scattering Process by the Method of Binary Collision Approximation

1. Effect of Ion Refocusing and Focusing at the Ne and Ar Small Angle Ion Bombardment on the Surface III-V Compound Semiconductors

   Karimov Muxtor Karimberganovich, Sadullaev Shuxrat Ravshanovich, Sobirov Ravshanbek Yuldashbaevich

   СтатьяIon-surface interactions and analysisInternational Journal of Trend in Scientific Research and Development2018Цитирований: 0

   ABIABI:AkademIndex/openalex/2018.article.000995