Structural and Optical Properties of Thin SbxSey Films Obtained at a Substrate Temperature of 400°C
Аннотация
SbxSey thin-films were deposited by chemical-molecular beam deposition (CMBD) on soda-lime glass from antimony (Sb) and selenium (Se) precursors. Due to the separate control of Sb (between 980 and 1025°C) and Se (between 415 and 470°C) source temperature, thin films of antimony selenide with different component ratios carry out obtained. The investigation encompassed a comprehensive analysis of the elemental and phase composition, like the crystal structure, of SbxSey films. To achieve this, a combination of analytical techniques was employed, including energy-dispersive X-ray microanalysis, atomic force microscopy, Raman spectroscopy, X-ray diffraction, and scanning electron microscopy. The bandgap of the films was ascertained in the region 1.03–1.25 eV through the acquisition of absorption spectra using a spectrophotometer. This enabled the determination of the films’ optical properties and facilitated further analysis of their potential applications. The physical properties of SbxSey films with various ratio were researched.