Structural, electrical, and thermoelectric properties of CrSi 2 thin films
Makram Abd El QaderDepartment of Electrical and Computer Engineering, University of Nevada, Las Vegas, 4505 Maryland Parkway, Las Vegas, NV 89154, USARama VenkatDepartment of Electrical and Computer Engineering, University of Nevada, Las Vegas, 4505 Maryland Parkway, Las Vegas, NV 89154, USARavhi S. KumarHiPSEC and Department of Physics and Astronomy, University of Nevada, Las Vegas, 4505 Maryland Parkway, Las Vegas, NV 89154, USAThomas HartmannHarry Reid Center for Environmental Studies, University of Nevada Las Vegas, 4505 Maryland Parkway, Las Vegas, NV 89154, USAP. GinobbiDepartment of Electrical and Computer Engineering, University of Nevada, Las Vegas, 4505 Maryland Parkway, Las Vegas, NV 89154, USAN. NewmanSchool for Engineering of Matter, Transport, and Energy, Arizona State University, 501 E. Tyler Mall, Tempe, AZ 85287-8706, USAR. K. SinghSchool for Engineering of Matter, Transport, and Energy, Arizona State University, 501 E. Tyler Mall, Tempe, AZ 85287-8706, USA
2013en
ABI
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