Работы, цитирующие эту работу

Работ: 4

Работа: Structural, electrical, and thermoelectric properties of CrSi 2 thin films

1. Formation of thin Crsi ₂ films by the solid-phase ion-plasma method and their thermoelectric properties

   I. R. Bekpulatov, Gunel Imanova, Б. Е. Умирзаков +5

   СтатьяAdvanced Thermoelectric Materials and DevicesMaterials Research Innovations2024Цитирований: 9

   ABIABI:AkademIndex/openalex/2024.article.000742

2. The solid-phase ion-plasma method and thermoelectric properties of thin CrSi2 films

   I. R. Bekpulatov, Gunel Imanova, S. H. Jabarov +8

   СтатьяAdvanced Thermoelectric Materials and DevicesJournal of Materials Science Materials in Electronics2024Цитирований: 6

   ABIABI:AkademIndex/openalex/2026.other.267087

3. Raman and IR Spectrum Analysis of CrSi2 Thin Films Formed in Direct Current and Variable Frequency Modes of a Magnetron Sputtering Device

   K.T. Dovranov, Maksim Vinnichenko, V.V. Korablev +3

   СтатьяChalcogenide Semiconductor Thin Films2024Цитирований: 2

   ABIABI:AkademIndex/openalex/2024.article.003101

4. Electrophysical Properties of Nanofilms Produced by Magnetron Sputtering Method

   Dovranov Kuvondik Turakulovich

   ГлаваSemiconductor materials and devicesIntechOpen eBooks2024Цитирований: 0

   ABIABI:AkademIndex/openalex/2024.chapter.000421