Maksim Vinnichenko

Работ: 5

Peter the Great St. Petersburg Polytechnic University,Saint Petersburg,Russian Federation

1. Raman and IR Spectrum Analysis of CrSi2 Thin Films Formed in Direct Current and Variable Frequency Modes of a Magnetron Sputtering Device

   K.T. Dovranov, Maksim Vinnichenko, V.V. Korablev +3

   СтатьяChalcogenide Semiconductor Thin Films2024Цитирований: 2

   ABIABI:AkademIndex/openalex/2024.article.003101

2. Obtaining Thin Films from Semiconductor Compounds and Their X-Ray Analysis

   K.T. Dovranov, Maksim Vinnichenko, Asilbek Kodirov +6

   СтатьяSurface and Thin Film Phenomena2024Цитирований: 2

   ABIABI:AkademIndex/openalex/2024.article.003102

3. Photoinduced Absorption Spectrum of GeSi/Si Quantum Dots in the Mid-IR and Terahertz Ranges under Resonant and Non-resonant Optical Pumping

   Danila Kararulov, Ratmir V. Ustimenko, G A Melentev +6

   СтатьяPhotonic and Optical Devices2024Цитирований: 0

   ABIABI:AkademIndex/openalex/2024.article.009016

4. Electrophysical Properties and Surface Characteristics of BaTiO ₃ Thin Films Produced by Ion-Plasma Method

   K.T. Dovranov, Muradulla Normuradov, I. R. Bekpulatov +6

   СтатьяFerroelectric and Piezoelectric Materials2025Цитирований: 0

   ABIABI:AkademIndex/openalex/2025.article.010647

5. Surface Morphology of Ni/GaAs Thin Films Produced by Ion-Plasma Method

   K.T. Dovranov, Shakhnoza Jurayeva, Muradulla Normuradov +6

   СтатьяSurface Roughness and Optical Measurements2025Цитирований: 0

   ABIABI:AkademIndex/openalex/2025.article.010648