Работы, цитирующие эту работу

Работ: 2

Работа: Deep-ultraviolet Raman investigation of silicon oxide: thin film on silicon substrate versus bulk material

1. Structure Determination and Defect Analysis n-Si<Lu>, p-Si<Lu> Raman Spectrometer Methods

   Khodjakbar S. Daliev, Sharifa B. Utamuradova, Zavkiddin E. Bahronkulov +2

   СтатьяSilicon Nanostructures and PhotoluminescenceEast European Journal of Physics2023Цитирований: 8

   ABIABI:AkademIndex/openalex/2026.other.121943

2. On the Properties of the Si-SiO2 Transition Layer in Multilayer Silicon Structures

   Shakhrukh Kh. Daliev, Fayzulla A. Saparov

   СтатьяSilicon Nanostructures and PhotoluminescenceEast European Journal of Physics2023Цитирований: 3

   ABIABI:AkademIndex/openalex/2026.other.402564