Работы, цитирующие эту работу

Работ: 2

Работа: The Systems of TOF-low Energy Ne Scattering Spectroscopy for Insulator

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   ABIABI:AkademIndex/openalex/2026.other.273060

2. Angular Distributions of Scattered Ne and Ar Ions at the Grazing Incidence on the InGaP (001) 110 Surface

   М. K. Kаrimov, Uchkun Kutliev, Kamola Otabaeva +1

   СтатьяRadiation Detection and Scintillator TechnologiesJournal of Nano- and Electronic Physics2020Цитирований: 6

   ABIABI:AkademIndex/openalex/2020.article.000326